AFM calibration standard, step height 20nm, mounted consumables The SEM double 45°specimen mount

The SEM double 45°specimen mount is made of aluminium with a grooved edge and 3

The black boxes have a black lid and do not have the alpha-numeric feature visible through the lid

containing potassium

Useful for wedge polishing using the PELCO tripod polisher

The compression-fit lid interior contains a numbered index sheet for cataloguing and identification

AFM calibration standard, step height 20nm, mounted consumables The SEM double 45°specimen mountThe HS series calibration standards offers an easy and reliable way to calibrate AFM systems. Primarily designed for accurate Z axis calibration the standards also offer X and Y axis calibration for bigger scanners in the 40 100m range. The structure symmetry enables calibration without the need to rotate and re align the sample in between x and Y axis calibration. The HS series feature silicon dioxide structure arrays on a 5x5mm silicon chip. The